Informace o projektu
Laboratoř tenkých vrstev a nanostruktur
- Kód projektu
- VS96102
- Období řešení
- 7/1996 - 12/2000
- Investor / Programový rámec / typ projektu
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Ministerstvo školství, mládeže a tělovýchovy ČR
- Posílení výzkumu na vysokých školách
- Fakulta / Pracoviště MU
- Přírodovědecká fakulta
Founding of a research laboratory for studies of thin-film systems and nanostructures attached to the Department of Solid State Physics at Faculty of Science, MU Brno. Selection of up-to-date topics backed by the experience of the Department, focusing onthe experimental methods competitive on the international scale, exploiting of the existing collaboration with domestic and foreign institutions. Some of the proposed research is founded by running grants. The immediate start of the activities of theLaboratory assumes several specific tasks of optical and X-ray studies of the SiGeC layers, quantum wells and superlattices of the GaAlInAsP systém, metallic multilayers, superconducting and polymer films. The scientific team of the Laboratory willcosnsist of four newly appinted, young physicsists, and four members of the Department.
Publikace
Počet publikací: 25
1998
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X-ray scattering study of interface roughness correlation in Mo/Si and Ti/C multilayers for X-UV optics
Physica B condensed matter, rok: 1998, ročník: 253(1998), vydání: -
1996
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Dynamical theory of diffraction of particles: Ewald approach. I.
Dynamical theory of diffraction of particles: Ewald approach, rok: 1996, počet stran: 34 s.
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Interface evolution after thermal treatment of Tungsten/ Silicon multilayers
Acta Crystallographica A, Suppl., rok: 1996, ročník: 52, vydání: -
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Multiple diffraction of particles by a system of point scatterers as an exactly soluble problem using the Ewald concept
J.Phys: Conds Matter, rok: 1996, ročník: 8, vydání: 1
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X-ray studies of surfaces and interfaces
Bulletin Krystalografické společnosti Materials Structure, rok: 1996, ročník: 3, vydání: 3